Conducted research on automated detection of Fusarium head blight (FHB) damaged wheat kernels. FHB causes yield reductions of up to 50% and crop losses in the U.S. have exceeded $1 billion.
The U.S. Quality Grains Research Consortium
Created a system that measures insect infestation of wheat kernels ussing electrical conductance. The system is low cost and can inspect a 1 kg sample in less than one minute. A partnership was formed with private industry to produce and market commercial versions of the system. The technology is currently being adopted by a major food manufacturing company.